Trace-Based Post-Silicon Validation for VLSI Circuits
Seiten
2016
|
Softcover reprint of the original 1st ed. 2014
Springer International Publishing (Verlag)
978-3-319-37594-6 (ISBN)
Springer International Publishing (Verlag)
978-3-319-37594-6 (ISBN)
This book surveys state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits, discusses key challenges in post-silicon validation and offers automated solutions that are systematic and cost-effective.
This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits. The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective. A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal selection for enhancing visibility of functional errors, a multiplexed signal tracing strategy for improving functional error detection, a tracing solution for debugging electrical errors, an interconnection fabric for increasing data bandwidth and supporting multi-core debug, an interconnection fabric design and optimization technique to increase transfer flexibility and a DfD design and associated tracing solution for improving debug efficiency and expanding tracing window. The solutions presented in this book improve the validation quality of VLSI circuits, and ultimately enable the design and fabrication of reliable electronic devices.
This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits. The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective. A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal selection for enhancing visibility of functional errors, a multiplexed signal tracing strategy for improving functional error detection, a tracing solution for debugging electrical errors, an interconnection fabric for increasing data bandwidth and supporting multi-core debug, an interconnection fabric design and optimization technique to increase transfer flexibility and a DfD design and associated tracing solution for improving debug efficiency and expanding tracing window. The solutions presented in this book improve the validation quality of VLSI circuits, and ultimately enable the design and fabrication of reliable electronic devices.
Introduction.- State of the Art on Post-Silicon Validation.- Signal Selection for Visibility Enhancement.- Multiplexed Tracing for Design Error.- Tracing for Electrical Error.- Reusing Test Access Mechanisms.- Interconnection Fabric for Flexible Tracing.- Interconnection Fabric for Systematic Tracing.- Conclusion.
| Erscheinungsdatum | 29.08.2016 |
|---|---|
| Reihe/Serie | Lecture Notes in Electrical Engineering |
| Zusatzinfo | XV, 108 p. 59 illus., 38 illus. in color. |
| Verlagsort | Cham |
| Sprache | englisch |
| Maße | 155 x 235 mm |
| Themenwelt | Mathematik / Informatik ► Informatik ► Theorie / Studium |
| Technik ► Elektrotechnik / Energietechnik | |
| Schlagworte | Circuits and Systems • Computer architecture and logic design • Correctness of VLSI Circuits • Design for Debug • Electronic devices and materials • Electronics: circuits and components • Engineering • Functional Error Detection • Post-silicon Validation • Processor Architectures • real-time embedded systems • semiconductors • Signal Tracing for Validation |
| ISBN-10 | 3-319-37594-6 / 3319375946 |
| ISBN-13 | 978-3-319-37594-6 / 9783319375946 |
| Zustand | Neuware |
| Informationen gemäß Produktsicherheitsverordnung (GPSR) | |
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