Critical Systems: Formal Methods and Automated Verification
Joint 21st International Workshop on Formal Methods for Industrial Critical Systems and 16th International Workshop on Automated Verification of Critical Systems, FMICS-AVoCS 2016, Pisa, Italy, September 26-28, 2016, Proceedings
Seiten
2016
|
1st ed. 2016
Springer International Publishing (Verlag)
9783319459424 (ISBN)
Springer International Publishing (Verlag)
9783319459424 (ISBN)
This book constitutes the refereed proceedings of the Joint 21st International Workshop on Formal Methods for Industrial Critical Systems and the 16th International Workshop on Automated Verification of Critical Systems, FMICS-AVoCS 2016, held in Pisa, Italy, in September 2016.The 11 full papers and 4 short papers presented together with one invited talk were carefully reviewed and selected from 24 submissions. They are organized in the following sections: automated verification techniques; model-based system analysis; and applications and case studies.
| Erscheinungsdatum | 11.10.2016 |
|---|---|
| Reihe/Serie | Lecture Notes in Computer Science | Programming and Software Engineering |
| Zusatzinfo | XVI, 247 p. 89 illus. |
| Verlagsort | Cham |
| Sprache | englisch |
| Maße | 155 x 235 mm |
| Themenwelt | Mathematik / Informatik ► Informatik ► Theorie / Studium |
| Schlagworte | Applications • Automata Theory • Computer architecture and logic design • Computer programming / software engineering • Computer Science • conference proceedings • Dynamic Analysis • formal methods • Gaussian processes • grammars and context-free languages • Informatics • linear type-systems • logic and verification • Logics and meanings of programs • Model Checking • monitorability • Monitoring algorithms • Quantitative semantics • regular languages • Research • runtime adaptation • software testing and debugging • Software Verification • spatio-temporal logic • transducers • Turing patterns • Uncertainty • weighted graphs |
| ISBN-13 | 9783319459424 / 9783319459424 |
| Zustand | Neuware |
| Informationen gemäß Produktsicherheitsverordnung (GPSR) | |
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