Zum Hauptinhalt springen
Nicht aus der Schweiz? Besuchen Sie lehmanns.de
Statistical Pattern Recognition - Andrew R. Webb

Statistical Pattern Recognition

(Autor)

Buch | Softcover
514 Seiten
2002 | 2nd Revised edition
John Wiley & Sons Ltd (Verlag)
978-0-470-84514-1 (ISBN)
CHF 79,95 inkl. MwSt
  • Titel ist leider vergriffen;
    keine Neuauflage
  • Artikel merken
Statistical pattern recognition is a very active area of study and research, which has seen many advances in recent years. New and emerging applications -- such as data mining, web searching, multimedia data retrieval, face recognition, and cursive handwriting recognition -- require robust and efficient pattern recognition techniques. Statistical decision making and estimation are regarded as fundamental to the study of pattern recognition. Statistical Pattern Recognition, Second Edition has been fully updated with new methods, applications and references. It provides a comprehensive introduction to this vibrant area -- with material drawn from engineering, statistics, computer science and the social sciences -- and covers many application areas, such as database design, artificial neural networks, and decision support systems. aeo Provides a self--contained introduction to statistical pattern recognition. aeo Each technique described is illustrated by real examples. aeo Covers Bayesian methods, neural networks, support vector machines, and unsupervised classification. aeo Each section concludes with a description of the applications that have been addressed and with further developments of the theory.
aeo Includes background material on dissimilarity, parameter estimation, data, linear algebra and probability. aeo Features a variety of exercises, from a open--booka questions to more lengthy projects. The book is aimed primarily at senior undergraduate and graduate students studying statistical pattern recognition, pattern processing, neural networks, and data mining, in both statistics and engineering departments. It is also an excellent source of reference for technical professionals working in advanced information development environments. For further information on the techniques and applications discussed in this book please visit www.statistical--pattern--recognition.net

Preface. Notation. Introduction to statistical pattern recognition. Density estimation -- parametric. Density estimation -- nonparametric. Linear discriminant analysis Nonlinear discriminant analysis -- kernel methods. Nonlinear discriminant analysis -- projection methods. Tree--based methods. Performance. Feature selection and extraction. Clustering. Additional topics. Appendices. References. Index.

Erscheint lt. Verlag 18.7.2002
Zusatzinfo Ill.
Verlagsort Chichester
Sprache englisch
Maße 172 x 244 mm
Gewicht 922 g
Einbandart Paperback
Themenwelt Informatik Theorie / Studium Künstliche Intelligenz / Robotik
Mathematik / Informatik Mathematik Angewandte Mathematik
Mathematik / Informatik Mathematik Statistik
Mathematik / Informatik Mathematik Wahrscheinlichkeit / Kombinatorik
ISBN-10 0-470-84514-7 / 0470845147
ISBN-13 978-0-470-84514-1 / 9780470845141
Zustand Neuware
Informationen gemäß Produktsicherheitsverordnung (GPSR)
Haben Sie eine Frage zum Produkt?
Mehr entdecken
aus dem Bereich
die materielle Wahrheit hinter den neuen Datenimperien

von Kate Crawford

Buch | Hardcover (2024)
C.H.Beck (Verlag)
CHF 44,75