Radiation Effects on Embedded Systems (eBook)

Pascal Fouillat, Ricardo Reis, Raoul Velazco (Herausgeber)

eBook Download: PDF

2007 | 2007
VIII, 269 Seiten
Springer Netherlands (Verlag)
978-1-4020-5646-8 (ISBN)

Infos

This volume provides an extensive overview of radiation effects on integrated circuits, offering major guidelines for coping with radiation effects on components. It contains a set of chapters based on the tutorials presented at the International School on Effects of Radiation on Embedded Systems for Space Applications (SERESSA) that was held in Manaus, Brazil, November 20-25, 2005.

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Radiation Effects on Embedded Systems aims at providing the reader with the major guidelines for coping with radiation effects on components supposed to be included in today's applications devoted to operate in space, but also in the atmosphere at high altitude or at ground level. It contains a set of chapters based on the tutorials presented at the International School on Effects of Radiation on Embedded Systems for Space Applications (SERESSA) that was held in Manaus, Brazil, from 20 to 25 November 2005.This book will provide all IC engineers with useful information regarding outside (environmental) influences on their designs and is an excellent reference.

Inhalt

CONTENTS 5
PREFACE 7
Radiation Space Environment 9
1 Space radiation effects 9
2 Other effects 15
References 17
Radiation Effects in Microelectronics 18
1. Introduction 18
2. MOS devices 20
3. Bipolar devices 25
4. Single-event effects 30
5. Summary 33
Acknowledgments 34
References 34
In-flight Anomalies on Electronic Devices 37
1. Introduction 37
2. Overview of radiation effects 38
2. In-flight anomalies and the space environment 41
3. Cumulated effects 46
4. Single event effects 55
5. The particular case of sensors 63
6. Dedicated instruments and experiments 71
References 73
Multi-level Fault Effects Evaluation 75
1. Introduction 75
2. The FARM model 77
3. Assumptions 80
4. Fault injection at the transistor level 82
5. Fault injection at the gate and register-transfer level 86
6. Fault injection at the system level 89
7. Conclusions 92
References 93
Effects of Radiation on Analog and Mixed-Signal Circuits 95
1. Introduction 95
2. Analog testing 97
3. First case study: SRAM-based FPAAs 100
4. Second case study: study: A/D converters 108
5. Analog self-checking design applied to SEUs and SETs mitigation 119
6. Concluding remarks 123
References 124
Fundamentals of the Pulsed Laser Technique for Single- Event Upset Testing 126
1. Introduction 126
2. Fundamentals of the laser testing technique 127
3. Pulsed laser systems for ICs testing 132
4. Applications of laser systems 135
5. Conclusions 144
Acknowledgments 145
References 145
Design Hardening Methodologies for ASICs 147
1. Introduction 147
2. Hardening against TID effects 148
3. Hardening against SEEs 155
4. Conclusion 161
References 162
Fault Tolerance in Programmable Circuits 165
1. Introduction 165
2. Radiation effects on SRAM-based FPGAs 167
3. Architectural SET and SEU mitigation techniques for SRAM-based FPGAs 172
4. High- level SEU mitigation techniques for SRAM- based FPGAs based on TMR 176
References 183
Automatic Tools for Design Hardening 186
1. Introduction 186
2. Automatic hardening of RTL designs 187
3. Automatic insertion of hardware redundancy 190
4. Automatic insertion of information redundancy 195
5. Error recovery actions 201
6. Conclusions 202
References 203
Test Facilities for SEE and Dose Testing 204
1. Introduction 204
2. Response of devices to radiation 205
3. Standards and guidelines 211
4. Test facilities and domain of application 214
Acknowledgment 233
References 233
Error Rate Prediction of Digital Architectures: Test Methodology and Tools 236
1. Introduction 236
2. Radiation ground testing requirements and objectives 237
3. Estimating error rates for a digital architecture 248
4. Combining radiation ground testing with fault injection sessions: an example 254
5. Dealing with more complex architectures 260
References 261
Using the SEEM Software for Laser SET Testing and Analysis 262
1. Introduction 262
2. Laser induced SET 263
3. SET analysis with laser testing and SEEM 266
4. Conclusions 270
References 270
INDEX 272

Produkt-Details

• Erscheint lt. Verlag: 19.6.2007
• Zusatzinfo: VIII, 269 p.
• Verlagsort: Dordrecht
• Sprache: englisch
• Themenwelt: Informatik ► Theorie / Studium ► Kryptologie
• Themenwelt: Naturwissenschaften ► Chemie ► Physikalische Chemie
• Themenwelt: Technik ► Elektrotechnik / Energietechnik
• Themenwelt: Technik ► Nachrichtentechnik
• Schlagworte: Analog • Circuit • Electronics • Embedded Systems • fault tolerance • Integrated circuit • Laser • microelectronics • radiation effects • Radiation ground testing • Signal • single-electron transistor • single event effects • Software • Testing
• ISBN-10: 1-4020-5646-X / 140205646X
• ISBN-13: 978-1-4020-5646-8 / 9781402056468