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Efficient Test Methodologies for High-Speed Serial Links

Dongwoo Hong, Kwang-Ting Cheng (Autoren)

Buch | Hardcover

98 Seiten

2009 | 2010 ed.
Springer (Verlag)
978-90-481-3442-7 (ISBN)

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Efficient Test Methodologies for High-Speed Serial Links describes in detail several new and promising techniques for cost-effectively testing high-speed interfaces with a high test coverage. One primary focus of Efficient Test Methodologies for High-Speed Serial Links is on efficient testing methods for jitter and bit-error-rate (BER), which are widely used for quantifying the quality of a communication system. Various analysis as well as experimental results are presented to demonstrate the validity of the presented techniques.

An Efficient Jitter Measurement Technique.- BER Estimation for Linear Clock and Data Recovery Circuit.- BER Estimation for Non-linear Clock and Data Recovery Circuit.- Gaps in Timing Margining Test.- An Accurate Jitter Estimation Technique.- A Two-Tone Test Method for Continuous-Time Adaptive Equalizers.- Conclusions.

Erscheint lt. Verlag	7.12.2009
Reihe/Serie	Lecture Notes in Electrical Engineering ; 51
Zusatzinfo	XII, 98 p.
Verlagsort	Dordrecht
Sprache	englisch
Maße	155 x 235 mm
Themenwelt	Mathematik / Informatik ► Informatik ► Theorie / Studium
	Informatik ► Weitere Themen ► Hardware
	Technik ► Elektrotechnik / Energietechnik
ISBN-10	90-481-3442-0 / 9048134420
ISBN-13	978-90-481-3442-7 / 9789048134427
Zustand	Neuware