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Electromigration in Metals Fundamentals to Nano-Interconnects von Paul S. Ho; Chao-Kun Hu; Martin Gall; Valeriy.. Buch | Hardcover 2022 | Cambridge University Press ISBN: 9781107032385 CHF 136,15 (inkl. MwSt) in den Warenkorb Versand in 10-20 Tagen