ISTFA

Book and CD-ROM Set

Media-Kombination

700 Seiten

2003
ASM International
978-0-87170-788-8 (ISBN)

Infos

This proceedings volume presents in-depth coverage of the latest developments and the most advanced techniques for microelectronics failure analysis. The CD-ROM presents the complete content of the book in fully searchable Adobe Acrobat PDF format. Contents: Fault Isolation of the Electrical Fail over Sample Presentation; Imaging and Material Analysis; Failure Analysis Process Flows on Individual Components; System-Level Performance; Manufacturing yield Enhancements; Packaging Issues and Solutions; Hot Topics such as Optical Probing and Tester-Driven Failure Analysis.

Produkt-Details

• Verlagsort: Ohio
• Sprache: englisch
• Themenwelt: Technik ► Elektrotechnik / Energietechnik
• Themenwelt: Technik ► Maschinenbau
• ISBN-10: 0-87170-788-8 / 0871707888
• ISBN-13: 978-0-87170-788-8 / 9780871707888
• Zustand: Neuware