Advances in Imaging and Electron Physics

Peter W. Hawkes, Benjamin Kazan, Tom Mulvey (Herausgeber)

Buch | Hardcover

458 Seiten

2003
Academic Press Inc (Verlag)
978-0-12-014768-7 (ISBN)

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Dealing with image processing and a major contribution on microscopy, this volume looks at theory and it's application in a practical sense, with an account of the methods used and realistic detailed application. It examines the developments, historic illustrations and mathematical fundamentals of the developments in imaging.

Image processing and a major contribution on microscopy dominate the latest volume of these advances. This volume looks at theory and it's application in a practical sense, with a full account of the methods used and realistic detailed application. The authors do this by examining the latest developments, historic illustrations and mathematical fundamentals of the exciting developments in imaging and applying them to realistic practical situations.Addressing and solving daily issues faced by researchers, consultants and engineers working in this field, makes this book essential reading

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

A Wavelet-Based Method for Mutlifractal Image Analysis: From Theoretical Concepts to Experimental Applications, An analysis of the Geometric Distortions Produced by Median and Related Image Processing Filters, Two-Photon Excitation Microscopy, Phase Closure Imaging, Three Dimensional Image Processing and Optical Scanning Holography, Nonlinear Image Processing using Artificial Neural Networks

Erscheint lt. Verlag	20.5.2003
Reihe/Serie	Advances in Imaging and Electron Physics
Verlagsort	San Diego
Sprache	englisch
Maße	152 x 229 mm
Gewicht	780 g
Themenwelt	Technik ► Elektrotechnik / Energietechnik
ISBN-10	0-12-014768-8 / 0120147688
ISBN-13	978-0-12-014768-7 / 9780120147687
Zustand	Neuware