Current Sensing Techniques and Biasing Methods for Smart Power Drivers (eBook)

Sri Navaneethakrishnan Easwaran (Autor)

eBook Download: PDF

2017 | 1st ed. 2018
XIX, 146 Seiten
Springer International Publishing (Verlag)
978-3-319-71982-5 (ISBN)

Infos

This book provides a detailed description of fault tolerant design techniques for smart power drivers and their application in the design of automotive airbag ICs to ensure correct deployment. The book begins with an introduction to the nature of electrical loads in the car, then moves on to describe various current sensing circuits, featuring thermal simulations. It shows how simple design techniques can be applied to ensure appropriate functionality of the IC under any power up condition. It concludes by introducing diagnostic circuits and measurement results. This book is a useful reference for automotive IC designers and provides specifications and design guidelines not found in the current literature.

Sri Navaneethakrishnan Easwaran was born in Erode, India on October 19, 1977. After finishing his Higher Secondary school, he received his Bachelor of Engineering, B.E. Degree (cum laude) in Electronics and Communication Engineering from  Shanmugha College of  Engineering  (affliated to Bharathidasan University, Tiruchirapalli, India), Thanjavur, India in 1998. He worked at SPIC Electronics, Chennai and STMicroelectronics, Noida, India between 1998 and 2000. From 2000 he worked for Philips Semiconductors at Bengaluru India, Zurich Switzerland and Nijmegen, The Netherlands where he designed analog circuits for Mobile Baseband and Power Management Units. While working at Philips Semiconductors, he received the International M.Sc. degree in Electrical Engineering from the University of Twente, Enschede, The Netherlands on the design of NMOS LDOs. From 2006 he started his work at Texas Instruments GmbH Freising, Germany and he joined the Technische Elektronik group at Friedrich-Alexander-Universität Erlangen-Nürnberg in January 2010 as an external Ph.D student. His research focused on the fault tolerant design of smart power drivers and diagnostic circuits.  Since September 2010 he is with Texas Instruments Inc, Dallas, Texas USA. He was elected as the Senior Member of IEEE in 2011, Member Group Technical Staff at Texas Instruments in 2014. He has more than 15 patents (US and German) in the field of Analog Mixed Signal IC Design and has IEEE and conference publications.

Inhalt

Abstract 6
Acknowledgements 8
Contents 10
Table of Symbols 13
Abbreviations 14
About the Author 15
Chapter 1: Introduction 16
1.1 Automotive Electronic System 17
1.2 Squib Driver Function 20
1.3 Squib Driver True Deployment and Inadvertent Deployment Conditions 21
1.4 Current Sensing and Regulation 23
1.5 Biasing Scheme 24
1.6 Voltage Reference and Voltage Clamping 25
References 26
Chapter 2: State-of-the-Art Current Sensing, Biasing Schemes and Voltage References 28
2.1 State-of-the-Art Current Sensing Schemes HS_FET 28
2.2 State-of-the-Art Current Sensing Schemes LS_FET 30
2.3 State-of-the-Art Energy Limitation 31
2.4 State-of-the-Art Biasing Scheme in Multiple Supply Voltage Domains 32
2.5 State-of-the-Art Biasing Scheme for Diagnostics 34
2.6 Problems with the State-of-the-Art Techniques 35
2.7 Specification 37
2.8 Chapters Organization 37
References 38
Chapter 3: Current Sensing Principles with Biasing Scheme 39
3.1 Current Sensing Circuit with Sense Resistor 39
3.2 Current Sensing Circuit with Sense Resistor and Current Limitation 41
3.3 Current Sensing Circuit with SenseFET and Current Limitation 41
3.4 Biasing Schemes 42
3.5 Typical Problems Observed in MSV Designs 46
3.6 Elementary Cells for Automotive Circuits 51
3.7 Maximum Voltage and Current Selector Circuits 52
3.8 Differential Voltage and Current Amplifiers 53
3.9 Summary and Conclusion 54
References 54
Chapter 4: High-Side Current Regulation and Energy Limitation 56
4.1 Sense Resistor and SenseFET Comparison 56
4.2 High-Side (HS_FET) Current Regulation 57
4.3 Rds_on Specification, Thermal Simulations and PowerFET Dimension 59
4.4 Metal Sense Resistor Dimension 63
4.5 Current Regulation and Small-Signal Analysis 65
4.6 Self-heating in Metal Resistors 75
4.7 Energy Limitation and Inadvertent Current Limitation 76
4.8 HS_FET, Gate Driver Layout 82
4.9 Summary and Conclusions 83
References 83
Chapter 5: Low-Side Current Regulation and Energy Limitation 85
5.1 SenseFET Topology and Current Sensing 85
5.2 Current Limitation Loop 86
5.3 Vds Equalizer (OTA1) in the Current Regulation Loop 94
5.4 Unpowered State Energy Limitation Circuit 98
5.5 Measurement Results 100
5.6 LS_FET, Gate Driver Layout 102
5.7 Summary and Conclusions 102
References 103
Chapter 6: Biasing Schemes and Diagnostics Circuit 104
6.1 Fault Mode Supply Generator and Current Selector Circuits 104
6.2 Voltage Clamping on the Output Buffer 108
6.3 Current Limited Voltage Source (CLVS) 115
6.4 CLVS with High-Side (HS) Regulation 117
6.5 Measurement Results 128
6.6 Chip Layout 130
6.7 Summary and Conclusions 133
References 133
Chapter 7: Conclusions and Future Work 134
7.1 Future Work 135
Appendix A 137
Small-Signal Analysis: HS Current Regulation 137
Appendix B 139
Small-Signal Analysis: LS Current Regulation 139
Appendix C 142
Small-Signal Analysis: HS_CLVS Voltage Loop 142
Appendix D 145
Small-Signal Analysis: HS_CLVS Current Loop 145
List of Publications 149
Granted Patent Publications 149
Journal Publications 149
Accepted Publications 149
Index 151

Produkt-Details

• Erscheint lt. Verlag: 28.12.2017
• Zusatzinfo: XIX, 146 p. 121 illus., 3 illus. in color.
• Verlagsort: Cham
• Sprache: englisch
• Themenwelt: Technik ► Elektrotechnik / Energietechnik
• Schlagworte: Automotive Electronic Systems • Biasing Scheme • Current Limitation • Current Selectors • Current Sensing and Regulation • Energy Limitation • Sense Resistor • Squib Driver Function • Voltage Clamping • Voltage Reference
• ISBN-10: 3-319-71982-3 / 3319719823
• ISBN-13: 978-3-319-71982-5 / 9783319719825