Microelectronic Failure Analysis
2001
I.E.E.E.Press (Hersteller)
978-0-7803-6802-6 (ISBN)
I.E.E.E.Press (Hersteller)
978-0-7803-6802-6 (ISBN)
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Managers and practicing engineers of failure analysis departments 30 Microelectronics Failure Analysis lectures were given at the University of New Mexico (UNM) in the Fall Semester of 1999. This course was given in the fall of 1997, but this 1999 version differs in that the background lectures were eliminated and initial lectures dealt directly with IC failure analysis. This graduate course was a joint venture of the University of New Mexico (UNM), Sandia National Labs, and the Product Analysis Forum (PAF) of Sematech. The participating lecturers were from AMD, Analytical Solutions, Ford/Visteon Microelectronics, Infineon, IBM, Intel, NIST, Sandia National Labs, Texas Instruments, and the University of New Mexico (UNM). The course was conceived to fill a void in university teaching of failure analysis and to allow experts from industry to participate in the course layout. The planning committee decided the best sequence of topics for the lectures and then invited persons from around the United States to give those lectures from the classroom in New Mexico.The 75 minute lectures were held at UNM on Tuesday and Thursday from 9:30 - 10:45 AM. The television signal was transmitted live via satellite to the National Technological University at Fort Collins, Colorado who then retransmitted the signal to 30 locations around the United States and Puerto Rico. The participant's major degree backgrounds were in Electrical Engineering, Chemical Engineering, and Physics. The academic level of the audience ranged from Ph.D., MS, BS to BET. The prerequisites were basic knowledge of transistor devices (MOSFET) and IC technology. Students obtained this either through the university curriculums,industrial experience, or both. A midterm and a final exam were given and students were required to write a term paper related to electronic failure analysis.The materials of this book were mostly done in PowerPoint slides by each author. These slides were then loaded at an ftp site at UNM so that all 30 locations in the United States (and individual students) could download at their facilities. An alternate web site provided Adobe Acrobat printouts using pdf files. This method allowed simultaneous distributions of materials across the country.This set consists of all thirty lectures on video-tape, presentation notes, plus the textbook, "Failure Analysis of Integrated Circuits - Toolsand Techniques" by Lawrence C. Wagner, Kluwer Academic Pub, 1999.
| Erscheint lt. Verlag | 31.1.2001 |
|---|---|
| Verlagsort | Piscataway NJ |
| Sprache | englisch |
| Themenwelt | Technik ► Elektrotechnik / Energietechnik |
| ISBN-10 | 0-7803-6802-9 / 0780368029 |
| ISBN-13 | 978-0-7803-6802-6 / 9780780368026 |
| Zustand | Neuware |
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