2001 IEEE International Reliability Physics Symposium

Buch | Softcover

474 Seiten

2001
I.E.E.E.Press (Verlag)
978-0-7803-6587-2 (ISBN)

Infos

Based on a reliability physics symposium, this CD-ROM covers topics including: device and process; device dielectrics; assembly and packaging; channel hot carriers; interconnects; ESD and latch-up; process induced damage; failure analysis; reliability; and optoelectronic emitters and detectors.

Produkt-Details

• Erscheint lt. Verlag: 31.5.2001
• Verlagsort: Piscataway NJ
• Sprache: englisch
• Themenwelt: Technik ► Elektrotechnik / Energietechnik
• ISBN-10: 0-7803-6587-9 / 0780365879
• ISBN-13: 978-0-7803-6587-2 / 9780780365872
• Zustand: Neuware