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Gettering and Defect Engineering in Semiconductor Technology XIV -

Gettering and Defect Engineering in Semiconductor Technology XIV

Software / Digital Media
516 Seiten
2011
Trans Tech Publications Ltd (Hersteller)
978-3-03795-057-9 (ISBN)
CHF 569,95 inkl. MwSt
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GADEST 2011


Selected, peer reviewed papers from the XIVth International Biannual Meeting on Gettering and Defect Engineering in Semiconductor (GADEST 2011), September 25-30, 2011, Loipersdorf, Austria
Volume is indexed by Thomson Reuters CPCI-S (WoS).
The papers contained herein cover the most important and timely issues in the field of “Gettering and Defect Engineering in Semiconductor Technology”, ranging from the theoretical analysis of defect problems to practical engineering solutions, with the emphasis on Si-based materials. Apart from the traditional topics of defect and materials engineering, characterization, modeling and simulation, and the co-integration of various material classes, topics such as materials for solar cells and photonics are discussed. Defects in graphene and in nanocrystals and nanowires are also treated, making this a very up-to-date survey of the field.
Reihe/Serie Solid State Phenomena ; Volumes 178-179
Verlagsort Zurich
Sprache englisch
Maße 125 x 142 mm
Gewicht 200 g
Themenwelt Technik Elektrotechnik / Energietechnik
Technik Maschinenbau
ISBN-10 3-03795-057-9 / 3037950579
ISBN-13 978-3-03795-057-9 / 9783037950579
Zustand Neuware
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