Advances in Imaging and Electron Physics (eBook)

Peter W. Hawkes (Herausgeber)

eBook Download: PDF

2002 | 1. Auflage
352 Seiten
Elsevier Science (Verlag)
978-0-08-052623-2 (ISBN)

Infos

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Inhalt

Cover 1
Contents 6
Contributors 8
Preface 10
Future Contributions 12
Chapter 1. The Structure of Quasicrystals Studied by Atomic-Scale Observations of Transmission Electron Microscopy 16
I. Introduction 17
II. Quasiperiodic Lattices 18
III. Experimental Procedures 35
IV. Electron Diffraction of Quasicrystals 37
V. High-Resolution Electron Microscopy Images of Quasicrystals 46
VI. Structure of Icosahedral Quasicrystals 51
VII. Structure of Decagonal Quasicrystals and Their Related Crystalline Phases 66
VIII. Concluding Remarks 96
References 97
Chapter 2. Add-On Lens Attachments for the Scanning Electron Microscope 102
I. Introduction 102
II. In-Lens Attachments 117
III. Single-Pole Lens Attachments 140
IV. Secondary Electron Energy Spectrometers 150
V. Multibore Objective Lenses 178
VI. Summary 185
References 185
Chapter 3. Electron Holography of Long-Range Electrostatic Fields 188
I. Introduction 189
II. Electron–Specimen Interaction 192
III. Recording and Processing of Electron Holograms 211
IV. Charged Dielectric Spheres 227
V. p–n Junctions 236
VI. Investigation of Charged Microtips 250
VII. Conclusions 257
VIII. Update 258
References 260
Chapter 4. Digital Image-Processing Technology Useful for Scanning Electron Microscopy and Its Practical Applications 266
I. Introduction 267
II. Proper Acquisition and Handling of SEM Images 268
III. Quality Improvement of SEM Images 279
IV. Image Measurement and Analysis 302
V. SEM Parameters Measurement 304
VI. Color SEM Images 318
VII. Automatic Focusing and Astigmatism Correction 327
VIII. Remote Control of the SEM 329
IX. Ultralow Magnification and Wide-Area Observation Using the Modern Montage Technique 332
X. Active Image Processing and Multimodal Microscopy 336
References 339
Index 344
Color Plate Section 352

Produkt-Details

• Erscheint lt. Verlag: 24.7.2002
• Sprache: englisch
• Themenwelt: Sachbuch/Ratgeber
• Themenwelt: Mathematik / Informatik ► Informatik
• Themenwelt: Naturwissenschaften ► Physik / Astronomie
• Themenwelt: Technik ► Bauwesen
• Themenwelt: Technik ► Elektrotechnik / Energietechnik
• Themenwelt: Technik ► Maschinenbau
• ISBN-10: 0-08-052623-3 / 0080526233
• ISBN-13: 978-0-08-052623-2 / 9780080526232