IEEE International Reliability Physics Symposium

IEEE Electron Devices Society, IEEE Reliability Society (Autoren)

Buch | Softcover

500 Seiten

2002 | Revised edition
I.E.E.E.Press (Verlag)
978-0-7803-7352-5 (ISBN)

Infos

This CD-ROM originates from the 2002 IEEE International Reliability Physics Symposium, and is concerned with electron devices. Its contents include: non volatile memory; dielectrics; hot carriers; assembly/packaging; device dielectrics; interconnects; product reliability; and device and process.

Inhalt

Non Volatile Memory; Dielectrics; Hot Carriers; Assembly/Packaging; Device Dielectrics; Device & Process; Interconnects; Non Volatile Memory; Product Reliability; Compound Semiconductor Failure Analysis

Produkt-Details

• Erscheint lt. Verlag: 31.5.2002
• Verlagsort: Piscataway NJ
• Sprache: englisch
• Maße: 216 x 279 mm
• Themenwelt: Naturwissenschaften ► Physik / Astronomie ► Angewandte Physik
• Themenwelt: Technik ► Elektrotechnik / Energietechnik
• ISBN-10: 0-7803-7352-9 / 0780373529
• ISBN-13: 978-0-7803-7352-5 / 9780780373525
• Zustand: Neuware