Advances in Imaging and Electron Physics (eBook)

Advances in Electron Microscopy and Diffraction

Peter W. Hawkes (Autor)

eBook Download: PDF

2002 | 1. Auflage
462 Seiten
Elsevier Science (Verlag)
978-0-08-052547-1 (ISBN)

Infos

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Inhalt

Cover 1
Contents 6
Contributors 10
Preface 12
Future Contributions 14
Chapter 1. Signposts in Electron Optics 18
I. Background 18
II. Charged-Particle Optics 20
III. Aberrations 24
IV. Aberration Correction 30
V. Monochromators 34
VI. Wave Optics 34
VII. Image Algebra 38
References 40
Chapter 2. Introduction to Crystallography 46
I . Introduction to Crystal Symmetry 46
II . Diffraction from a Lattice 70
References 87
Chapter 3. Convergent Beam Electron Diffraction 88
I. Introduction 88
II. More Advanced Topics 99
Bibliography 118
References 118
Chapter 4. High-Resolution Electron Microscopy 122
I. Basic Principles of Image Formation 123
II. The Electron Microscope 137
III. Interpretation of the Images 164
IV. Quantitative HREM 168
V. Precision and Experimental Design 184
VI. Future Developments 185
References 186
Chapter 5. Structure Determination through Z-Contrast Microscopy 190
I. Introduction 190
II. Quantum Mechanical Aspects of Electron Microscopy 192
III. Theory of Image Formation in the STEM 203
IV. Examples of Structure Determination by Z-Contrast Imaging 208
V. Practical Aspects of Z-Contrast Imaging 217
VI. Future Developments 219
VII. summary 219
References 220
Chapter 6. Electron Holography of Long-Range Electromagnetic Fields: A Tutorial 224
I. Introduction 224
II. General Considerations 225
III. The Magnetized Bar 229
IV. Electrostatic Fields: A Glimpse at Charged Microtips and Reverse-Biased p-n Junctions 235
V. Conclusion 238
References 238
Chapter 7. Electron Holography: A Powerful Tool for the Analysis of Nanostructures 242
I. Electron Interference 242
II. Electron Coherence 244
III. Electron Wave Interaction with Object 246
IV. Conventional Electron Microscopy (TEM) 248
V. Electron Holography 255
VI. Summary 271
Suggested Reading 271
References 271
Chapter 8. Crystal Structure Determination from EM Images and Electron Diffraction Patterns 274
I. Solution of Unknown Crystal Structures by Electron Crystallography 274
II. The Two Steps of Crystal Structure Determination 275
III. The Strong Interaction between Electrons and Matter 276
IV. Determination of Structure Factor Phases 277
V. Crystallographic Structure Factor Phases in EM Images 282
VI. The Relation between Projected Crystal Potential and HRTEM Images 283
VII. Recording and Quantification of HRTEM Images and SAED . Patterns for Structure Determination 284
VIII. Extraction of Crystallographic Amplitudes and Phases from HRTEM Images 286
IX. Determination of and Compensation for Defocus and Astigmatism 288
X. Determination of the Projected Symmetry of Crystals 293
XI. Interpretation of the Projected Potential Map 296
XII. Quantification of and Compensation for Crystal Thickness and Tilt 297
XIII. Crystal Structure Refinement 299
XIV. Extension of Electron Crystallography to Three Dimensions 302
XV. Conclusion 303
References 303
Chapter 9. Direct Methods and Applications to Electron Crystallography 308
I. Introduction 308
II. The Minimal Prior Information 309
III. Scaling of the Observed Intensities 310
IV. The Normalized Structure Factors and Their Distributions 312
V. Two Basic Questions Arising from the Phase Problem 312
VI. The Structure Invariants 315
VII. A Typical Phasing Procedure 321
VIII. Direct Methods for Electron Diffraction Data 323
References 326
Chapter 10. Strategies in Electron Diffraction Data Collection 328
I. Introduction 328
II. Method to Improve the Dynamic Range of Charge-Coupled Device CCD) Cameras 329
III. ELD and QED: Two Software Packages for ED Data Processing 330
IV. The Three-Dimensional Merging Procedure 331
V. The Precession Technique 333
VI. Conclusion 341
References 342
Chapter 11. Advances in Scanning Electron Microscopy 344
I. Introduction 344
II. The Classical SEM 345
III. Advances in the Design of the SEM Column 357
IV. Specimen Environment and Signal Detection 374
References 387
Chapter 12. On the Spatial Resolution and Nanoscale Feature Visibility in Scanning Electron Microscopy 392
I. Introduction 392
II. Backscattered Electron Imaging 396
III. Secondary Electron Imaging 408
IV. BSE-to-SE Conversion 410
V. Conclusion 413
References 414
Chapter 13. Nanoscale Analysis by Energy-Filtering TEM 416
I. Introduction 416
II. Elemental Mapping 417
III. Quantitative Analysis of ESI Series 422
IV. Mapping of ELNES 426
V. Conclusion 428
References 428
Chapter 14. Ionization Edges: Some Underlying Physics and Their Use in Electron Microscopy 430
I. Introduction 430
II. Elastic and Inelastic Collisions 432
III. Counting the Elastic and Inelastic Events 435
IV. Transitions to the Unoccupied States 437
V. Electron-Atom Interaction 439
VI. Orientation Dependence 446
VII. Orders of Magnitude 447
VIII. Mixed Dynamic Form Factor 449
IX. Examples of Applications 452
X. Images 462
XI. Conclusion 463
Appendix 463
References 464
Index 468

Produkt-Details

• Erscheint lt. Verlag: 5.11.2002
• Sprache: englisch
• Themenwelt: Sachbuch/Ratgeber
• Themenwelt: Mathematik / Informatik ► Informatik
• Themenwelt: Naturwissenschaften ► Physik / Astronomie
• Themenwelt: Technik ► Bauwesen
• Themenwelt: Technik ► Elektrotechnik / Energietechnik
• Themenwelt: Technik ► Maschinenbau
• ISBN-10: 0-08-052547-4 / 0080525474
• ISBN-13: 978-0-08-052547-1 / 9780080525471