Memories in Wireless Systems (eBook)

Rino Micheloni, Giovanni Campardo, Piero Olivo (Herausgeber)

eBook Download: PDF

2008 | 2008
XVI, 310 Seiten
Springer Berlin (Verlag)
978-3-540-79078-5 (ISBN)

Infos

For the technological progress in communication technology it is necessary that the advanced studies in circuit and software design are accompanied with recent results of the technological research and physics in order to exceed its limitations.

This book is a guide which treats many components used in mobile communications, and in particular focuses on non-volatile memories. It emerges following the conducting line of the non-volatile memory in the wireless system: On the one hand it develops the foundations of the interdisciplinary issues needed for design analysis and testing of the system. On the other hand it deals with many of the problems appearing when the systems are realized in industrial production. These cover the difficulties from the mobile system to the different types of non-volatile memories.

The book explores memory cards, multichip technologies, and algorithms of the software management as well as error handling. It also presents techniques of assurance for the single components and a guide through the Datasheet lectures.

Inhalt

Contents 7
About the Editors 9
Introduction 13
Hardware Platforms for Third-Generation Mobile Terminals 16
1.1 Introduction 16
1.2 Computation Units 18
1.3 The Memory System 23
1.4 The Display 29
1.5 The Transceiver 31
1.6 The Bus 36
1.7 Conclusions 41
References 42
Nonvolatile Memories: NOR vs. NAND Architectures 44
2.1 Introduction 44
2.2 The Read Operation in Flash Memories 45
2.3 Program Operation in Flash Memories 52
2.4 Erase Operation in Flash Memories 60
References 68
Nonvolatile Memories: Novel Concepts and Emerging Technologies 70
3.1 Introduction 70
3.2 Flash Technologies: Challenges and Perspectives 71
3.3 Emerging Nonvolatile Memories: Concepts, Materials and Architectures 76
References 80
Memory Cards 82
4.1 Introduction 82
4.2 Flash Card Description 85
4.3 The Standards on the Market 101
4.4 Multimedia Applications 106
References 108
Multichip 110
5.1 Introduction 110
5.2 Triple Stacked Multichip: from Feasibility Study to Samples 115
5.3 From Samples to Production 125
5.4 Evaluation of the Electrical Effects of the Package 129
5.5 Signal Integrity 132
5.6 How to Design a Substrate 134
5.7 How to Perform a Signal Integrity Analysis 135
5.8 Digital Signal Spectrum 136
5.9 Multichip Testing: Observability, Controllability, Reliability 138
5.10 Vertical Integration 142
5.11 Advanced Technological Solutions 145
References 147
Software Management of Flash Memories 150
6.1 Introduction 150
6.2 Software for Data Management on Flash Memories 151
6.3 Software Methodologies for Flash Memory Management 156
6.4 Code Storage 159
6.5 Common Problems in Flash Memory Software Management 160
6.6 SW Architectures 167
6.7 Disk Emulator 171
References 173
Error Correction Codes 174
7.1 Introduction 174
7.2 Error Sources in Flash Memories 175
7.3 Basic Concepts 176
7.4 ECC Effect on Error Probability 180
7.5 Hamming Code 183
7.6 Applications: NOR Flash Memory 186
7.7 Applications: MLC NOR Flash Memory 191
7.8 Algorithmic Hamming Code for Big Size Blocks 193
7.9 Conclusions 198
References 198
Board Level Reliability 200
8.1 Introduction 200
8.2 Bend Test 201
8.3 Drop Test 210
8.4 Thermal Cycling 231
References 233
Reliability in Wireless Systems 236
9.1 Introduction 236
9.2 Reliability Prediction Models (Phase 1) 241
9.3 Reliability Improvement (Phase 2) 248
9.4 Demonstration of Reliability Levels (Phase 3) 250
9.5 Screening/Burn-In, Defectiveness and Fault Tolerance ( Phase 4) 257
References 262
How to Read a Datasheet 264
10.1 Introduction 264
10.2 Contents of the First Page 264
10.3 Ball Out and Functional Block Diagram 266
10.4 Main Operations Allowed 268
10.5 Maximum Ratings and DC-AC Parameters 269
10.6 DC Parameters Benchmark Between Memories for the Multi- Chip 271
10.7 How to Read Timing Chart and AC Table 272
10.8 NOR Memory Read Timings 272
10.9 RAM Memory Read Timings 275
10.10 Read Timings for NAND Memory 275
10.11 NOR Memory Timings for Modify Operations 280
10.12 RAM Memory Timings for Modify Operations 283
10.13 NAND Memory Timings for Modify Operations 285
10.14 From Timing to Testing 287
References 288
Appendix A 300
A.1 Basic Elements 300
A.2 Read Operation 301
A.3 Program Operation 302
A.4 Erase Operation 302
A.5 Main Building Blocks of a Nonvolatile Memory 303
Bibliography 309
About the Authors 312
Index 320

Produkt-Details

• Erscheint lt. Verlag: 24.7.2008
• Reihe/Serie: Signals and Communication Technology
• Zusatzinfo: XVI, 310 p. 196 illus.
• Verlagsort: Berlin
• Sprache: englisch
• Themenwelt: Mathematik / Informatik ► Informatik
• Themenwelt: Technik ► Elektrotechnik / Energietechnik
• Themenwelt: Technik ► Maschinenbau
• Themenwelt: Technik ► Nachrichtentechnik
• Schlagworte: Communication • Hardware • Memory cards • Multichip Technology • Non-volatile Memory • Physics • Production • Reliability • Software Management • Testing
• ISBN-10: 3-540-79078-0 / 3540790780
• ISBN-13: 978-3-540-79078-5 / 9783540790785