Mechanics of Microelectronics (eBook)

W.D. van Driel, X.J. Fan, G.Q. Zhang (Autoren)

eBook Download: PDF

2006 | 2006
XIV, 566 Seiten
Springer Netherlands (Verlag)
978-1-4020-4935-4 (ISBN)

Infos

This book is written by leading experts with both profound knowledge and rich practical experience in advanced mechanics and the microelectronics industry essential for current and future development. It aims to provide the cutting edge knowledge and solutions for various mechanical related problems, in a systematic way. It contains important and detailed information about the state-of-the-art theories, methodologies, the way of working and real case studies.

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The technology trends of Microelectronics and Microsystems are mainly characterized by miniaturization down to the nano-scale, increasing levels of system and function integration, and the introduction of new materials, while the business trends are mainly characterized by cost reduction, shorter-time-to market and outsourcing. Combination of these trends leads to increasing design complexity, dramatically decreasing design margins and process windows, reducing product development and qualification times, increasing risks of failures, and increasing difficulties to meet quality, robustness and reliability requirements. Consequentially, thermo-mechanical related failures, accounting for more than 65% of the total reliability failures, become the bottleneck for both current and future product and technology developments. From a mechanical engineering point of view, Microelectronics and Microsystems are multi-scale in both geometric and time domains, multi-process, multi-functionality, multi-disciplinary, multi-material/interface, multi-damage and multi-failure mode. Their responses in manufacturing, assembling, qualification tests and application conditions are strongly nonlinear and stochastic. Mechanics of Microelectronics is extremely important and challenging, in terms of both industrial applications and academic research. Written by the leading experts with both profound knowledge and rich practical experience in advanced mechanics and microelectronics industry, this book aims to provide the cutting edge knowledge and solutions for various mechanical related problems, in a systematic way. It contains essential and detailed information about the state-of-the-art theories, methodologies, the way of working and real case studies, covering the contents of:The trends in Microelectronics and MicrosystemsReliability engineering and practicesThermal managementAdvanced mechanics Thermo-mechanics of integrated circuits and packagesCharacterization and modelling of moisture behaviourCharacterization and modelling of solder joint reliabilityVirtual thermo-mechanical prototypingChallenges and future perspectives.

Inhalt

CONTENTS 6
PREFACE 12
MICROELECTRONICS TECHNOLOGY 15
RELIABILITY PRACTICE 49
THERMAL MANAGEMENT 79
INTRODUCTION TO ADVANCED MECHANICS 109
THERMO-MECHANICS OF INTEGRATED CIRCUITS AND PACKAGES 183
CHARACTERIZATION AND MODELLING OF MOISTURE BEHAVIOUR 295
CHARACTERIZATION AND MODELLING OF SOLDER JOINT RELIABILITY 391
VIRTUAL THERMO-MECHANICAL PROTOTYPING 483
CHALLENGES AND FUTURE PERSPECTIVES 551

Textauszug

Chapter 7
CHARACTERIZATION AND MODELLING OF SOLDER JOINT RELIABILITY (p. 378)

R. Dudek
Fraunhofer Institute Zuverlassigkeit und Mikrointegration, Gustav-Meyer-A - llee 25, 13355
Berlin, Germany

Abstract: This chapter addresses finite-element analyses (FEA) of solder fatigue phenomena caused by low-cycle thermo-mechanical loading. To begin with, an introduction to board level solder joint fatigue, characteristic thermal loading situations, the effects of thermal mismatch and analytical lifetime estimates is provided. Subsequently, challenges to the FE-based methodologies are discussed, which are particularly related to the non-linear mechanical properties of soft solders. Material constitutive models and the implementation of time and temperature dependent behaviours of leaded and lead-free solders are described. d Fatigue-life prediction modelling focuses on the strength of materials approaches, i.e., creep strain-based relations or energy-based relations. An overview on several fatigue-life prediction models from the literature is additionally provided. The FE-based methodology is applied to board-level solder joint reliability assessments for several components. Its wide applicability is illustrated by the choice of different types of components ranging from large t ceramic surface mount to small flip-chip assemblies on different types of substrates. For some of the application cases, results of parametric studies are presented and comparisons between failure prediction and testing results are made.

Key words: Solder fatigue, Finite Element simulations, solder plasticity, solder creep, primary and secondary creep, reliability predictions, coffin manson, board level test validation.

1. INTRODUCTION

The computational design of reliable microsystems, electronic packages as well as their interconnects can minimize expensive prototype development and testing. Accordingly, finite element (FE-) modelling is widely used to perform parametric studies on the thermo-mechanical behaviour of components like e.g., silicon microstructures, plastic packages, chip size/wafer level packages, or flip chip assemblies.

From a mechanical point of view all these structures include constituents, which are subjected to different loading conditions. The theoretical analysis of stresses within these constituents induced by environmental conditions requires the characterization of loads and material properties, respectively, as well as the knowledge of the appropriate failure criteria. Figure 1 provides an overview on the characteristic tasks to be performed for those thermomechanical finite element analyses (FEA).

Produkt-Details

• Erscheint lt. Verlag: 25.8.2006
• Reihe/Serie: Solid Mechanics and Its Applications
• Zusatzinfo: XIV, 566 p.
• Verlagsort: Dordrecht
• Sprache: englisch
• Themenwelt: Informatik ► Theorie / Studium ► Künstliche Intelligenz / Robotik
• Themenwelt: Mathematik / Informatik ► Mathematik ► Statistik
• Themenwelt: Mathematik / Informatik ► Mathematik ► Wahrscheinlichkeit / Kombinatorik
• Themenwelt: Technik ► Bauwesen
• Themenwelt: Technik ► Elektrotechnik / Energietechnik
• Themenwelt: Technik ► Maschinenbau
• Schlagworte: Computer-Aided Design (CAD) • Design • Development • Electronic Packaging • mechanical engineering • Mechanics • microelectronics • Modeling • Optimization • Reliability • Simulation • stability • Statistics • thermo-mechanics • Virtual Prototyping
• ISBN-10: 1-4020-4935-8 / 1402049358
• ISBN-13: 978-1-4020-4935-4 / 9781402049354