Applied Scanning Probe Methods
Springer Berlin
978-3-540-88823-9 (ISBN)
Examining the physical and technical foundation for recent progress with this technique, Applied Scanning Probe Methods offers a timely and comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. First it lays the theoretical background of static and dynamic force microscopies, including sensor technology and tip characterization, contributions detail applications such as macro- and nanotribology, polymer surfaces, and roughness investigations. The final part on industrial research addresses special applications of scanning force nanoprobes such as atomic manipulation and surface modification, as well as single electron devices based on SPM.
With this field progressing so fast, the volumes of this series comprise the state of the art of and the progress in the development of the SPM techniques itself, characterization methods as well as biomimetics and industrial application areas.
Dr. Bharat Bhushan received an M.S. in mechanical engineering from the Massachusetts Institute of Technology in 1971, an M.S. in mechanics and a Ph.D. in mechanical engineering from the University of Colorado at Boulder in 1973 and 1976, respectively, an MBA from Rensselaer Polytechnic Institute at Troy, NY in 1980, Doctor Technicae from the University of Trondheim at Trondheim, Norway in 1990, a Doctor of Technical Sciences from the Warsaw University of Technology at Warsaw, Poland in 1996, and Doctor Honoris Causa from the Metal-Polymer Research Institute of National Academy of Sciences at Gomel, Belarus in 2000. He is a registered professional engineer (mechanical) and presently an Ohio Eminent Scholar and The Howard D. Winbigler Professor in the Department of Mechanical Engineering, Graduate Research Faculty Advisor in the Department of Materials Science and Engineering, and the Director of the Nanotribology Laboratory for Information Storage & MEMS/NEMS (NLIM) at the Ohio State University, Columbus, Ohio. He is an internationally recognized expert of tribology on the macro- to nanoscales, and is one of the most prolific authors in the field. He is considered by some a pioneer of the tribology and mechanics of magnetic storage devices and a leading researcher in the fields of nanotribology and nanomechanics using scanning probe microscopy and applications to micro/nanotechnology.
| Erscheint lt. Verlag | 27.2.2009 |
|---|---|
| Reihe/Serie | NanoScience and Technology |
| Zusatzinfo | CL, 4800 p. 13 volume-set. |
| Verlagsort | Berlin |
| Sprache | englisch |
| Maße | 155 x 235 mm |
| Gewicht | 9042 g |
| Themenwelt | Technik ► Maschinenbau |
| Schlagworte | Abtastung (Technik) • Hardcover, Softcover / Technik/Maschinenbau, Fertigungstechnik • Material Science • Microscopy • Nanoscience • Nanotechnologie • Physical Chemistry • Rasterelektronenmikroskopie • reference work • Scanning Probe Methods • SPM • Surface Science |
| ISBN-10 | 3-540-88823-3 / 3540888233 |
| ISBN-13 | 978-3-540-88823-9 / 9783540888239 |
| Zustand | Neuware |
| Informationen gemäß Produktsicherheitsverordnung (GPSR) | |
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